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Modern Interferometry for Length Metrology : Exploring limits and novel techniques

La Description Livre

Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. Within the book advanced solutions, which can be used for various applications and can help provide a comprehensive understanding of both metrology and interferometry, have been developed and discussed.


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Détails Livres

Author(s)
Professor Rene Schoedel, Dr. Florian Pollinger, Dr. Arnold Nicolaus, Dr. Guido Bartl, Dr Thilo Schuldt, Dr. Nandini Bhattacharya, Dr. Steven van den Berg, Prof. Dr. Seung-Woo Kim, Dr. Yoon-Soo Jang, Prof. Dr. Armin Reichhold
Format
Hardback | 324 pages
Dimensions
178 x 254 x 19mm | 780g
Publication date
15 Mar 2019
Publisher
Institute of Physics Publishing
Publication City/Country
Bristol, United Kingdom
Language
English
Illustrations note
With figures in colour and in black and white
ISBN10
0750315768
ISBN13
9780750315760