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La Description Livre
Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. Within the book advanced solutions, which can be used for various applications and can help provide a comprehensive understanding of both metrology and interferometry, have been developed and discussed.
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- Professor Rene Schoedel, Dr. Florian Pollinger, Dr. Arnold Nicolaus, Dr. Guido Bartl, Dr Thilo Schuldt, Dr. Nandini Bhattacharya, Dr. Steven van den Berg, Prof. Dr. Seung-Woo Kim, Dr. Yoon-Soo Jang, Prof. Dr. Armin Reichhold
- Hardback | 324 pages
- 178 x 254 x 19mm | 780g
- Publication date
- 15 Mar 2019
- Institute of Physics Publishing
- Publication City/Country
- Bristol, United Kingdom
- Illustrations note
- With figures in colour and in black and white